Low Temperature Scanning Probe Microscope

by Dr. Pina Bhatt
₹ 300
ISBN Number : 978- 1-73032- 785-8

Dr. Pina Bhatt

Professor, Shankersinh Vaghela Bapu Institute of Technology, Gandhinagar.


Book Overview

The remarkable feature of Scanning Probe Microscopes (SPM) is their ability to “View” details at the atomic and molecular level, thus increasing our understanding of how systems work and leading to new discoveries in many fields. These include life science, materials science, electrochemistry, polymer science, biophysics, nano technology and biotechnology.2,20 The atomic force microscope (AFM) was also invented by Binning et al. in 1986. While the STM measures the tunneling current (conducting surface), the AFM measures the forces acting between a fine tip and a sample. The tip is attached to the free end of a cantilever and is brought very close to a surface. Attractive or repulsive forces resulting from interactions between the tip and the surface will cause a positive or negative bending of the cantilever.2,20,21 The bending is detected by means of a laser beam, which is reflected from the backside of the cantilever.